Datenblatt-Suchmaschine für elektronische Bauteile |
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74FCT163H952CPVCT Datenblatt(PDF) 2 Page - Texas Instruments |
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74FCT163H952CPVCT Datenblatt(HTML) 2 Page - Texas Instruments |
2 / 10 page CY74FCT163952 CY74FCT163H952 2 Maximum Ratings[5, 6] (Above which the useful life may be impaired. For user guide- lines, not tested.) Storage Temperature ..................................–55 °C to +125°C Ambient Temperature with Power Applied .............................................–55 °C to +125°C Supply Voltage Range......................................0.5V to +4.6V DC Input Voltage ............................................–0.5V to +7.0V DC Output Voltage .........................................–0.5V to +7.0V DC Output Current (Maximum Sink Current/Pin) ........................ –60 to +120 mA Power Dissipation.......................................................... 1.0W Pin Description Name Description OEAB A-to-B Output Enable Input (Active LOW) OEBA B-to-A Output Enable Input (Active LOW) CEAB A-to-B Clock Enable Input (Active LOW) CEBA B-to-A Clock Enable Input (Active LOW) CLKAB A-to-B Clock Input CLKBA B-to-A Clock Input A A-to-B Data Inputs or B-to-A Three-State Outputs[1] B B-to-A Data Inputs or A-to-B Three-State Outputs[1] Function Table[2, 3] For A-to-B (Symmetric with B-to-A) Inputs Outputs CEAB CLKAB OEAB A B H X L X B[4] X L L X B[4] L L L L L L H H X X H X Z Operating Range Range Ambient Temperature VCC Industrial –40 °C to +85°C 2.7V to 3.6V Electrical Characteristics for Non Bus Hold Devices Over the Operating Range VCC=2.7V to 3.6V Parameter Description Test Conditions Min. Typ.[7] Max. Unit VIH Input HIGH Voltage All Inputs 2.0 5.5 V VIL Input LOW Voltage 0.8 V VH Input Hysteresis[8] 100 mV VIK Input Clamp Diode Voltage VCC=Min., IIN=–18 mA –0.7 –1.2 V IIH Input HIGH Current VCC=Max., VI=5.5 ±1 µA IIL Input LOW Current VCC=Max., VI=GND ±1 µA IOZH High Impedance Output Current (Three-State Output pins) VCC=Max., VOUT=5.5V ±1 µA IOZL High Impedance Output Current (Three-State Output pins) VCC=Max., VOUT=GND ±1 µA IOS Short Circuit Current[9] VCC=Max., VOUT=GND –60 –135 –240 mA IOFF Power-Off Disable VCC=0V, VOUT≤4.5V ±100 µA ICC Quiescent Power Supply Current VIN≤0.2V, VIN>VCC–0.2V VCC=Max. 0.1 10 µA ∆I CC Quiescent Power Supply Current (TTL inputs HIGH) VIN=VCC–0.6V [10] VCC=Max. 2.0 30 µA Notes: 1. On the CY74FCT163H952, these pins have bus hold. 2. A-to-B data flow is shown: B-to-A data flow is similar but uses, CEBA, CLKBA, and OEBA. 3. H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care. = LOW-to-HIGH Transition. Z = HIGH Impedance. 4. Level of B before the indicated steady-state input conditions were established. 5. Operation beyond the limits set forth may impair the useful life of the device. Unless otherwise noted, these limits are over the operating free-air temperature. 6. With the exception of inputs with bus hold, unused inputs must always be connected to an appropriate logic voltage level, preferably either VCC or ground, 7. Typical values are at VCC=3.3V, TA = +25˚C ambient. 8. This parameter is specified but not tested. 9. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter tests, IOS tests should be performed last. 10. Per TTL driven input; all other inputs at VCC or GND. |
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