Datenblatt-Suchmaschine für elektronische Bauteile |
|
SN74ABTH182646A Datenblatt(PDF) 3 Page - Texas Instruments |
|
|
SN74ABTH182646A Datenblatt(HTML) 3 Page - Texas Instruments |
3 / 41 page SN54ABTH18646A, SN54ABTH182646A, SN74ABTH18646A, SN74ABTH182646A SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS166D – AUGUST 1993 – REVISED JULY 1996 3 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 description (continued) In the test mode, the normal operation of the SCOPE ™ bus transceivers and registers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990. Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. Improved scan efficiency is accomplished through the adoption of a one boundary-scan cell (BSC) per I/O pin architecture. This architecture is implemented in such a way as to capture the most pertinent test data. A PSA/COUNT instruction also is included to ease the testing of memories and other circuits where a binary count addressing scheme is useful. Active bus-hold circuitry holds unused or floating data inputs at a valid logic level. The B-port outputs of ’ABTH182646A, which are designed to source or sink up to 12 mA, include 25- Ω series resistors to reduce overshoot and undershoot. The SN54ABTH18646A and SN54ABTH182646A are characterized for operation over the full military temperature range of –55 °C to 125°C. The SN74ABTH18646A and SN74ABTH182646A are characterized for operation from –40 °C to 85°C. FUNCTION TABLE (normal mode, each 9-bit section) INPUTS DATA I/O OPERATION OR FUNCTION OE DIR CLKAB CLKBA SAB SBA A1 – A9 B1 – B9 OPERATION OR FUNCTION X X ↑ X X X Input Unspecified† Store A, B unspecified† X XX ↑ X X Unspecified† Input Store B, A unspecified† H X ↑ ↑ X X Input Input Store A and B data H X L L X X Input disabled Input disabled Isolation, hold storage L L X X X L Output Input Real-time B data to A bus L L X X X H Output Input disabled Stored B data to A bus L H X X L X Input Output Real-time A data to B bus L H X X H X Input disabled Output Stored A data to B bus † The data-output functions can be enabled or disabled by various signals at OE and DIR. Data-input functions are always enabled; i.e., data at the bus pins is stored on every low-to-high transition of the clock inputs. |
Ähnliche Teilenummer - SN74ABTH182646A |
|
Ähnliche Beschreibung - SN74ABTH182646A |
|
|
Link URL |
Privatsphäre und Datenschutz |
ALLDATASHEETDE.COM |
War ALLDATASHEET hilfreich? [ DONATE ] |
Über Alldatasheet | Werbung | Kontakt | Privatsphäre und Datenschutz | Linktausch | Hersteller All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |