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SM65MLVD128DGGR Datenblatt(PDF) 1 Page - Texas Instruments

Teilenummer SM65MLVD128DGGR
Bauteilbeschribung  1:8 LVTTL TO M-LVDS REPEATER DUAL 1:4 LVTTL TO M-LVDS REPEATER
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Direct Link  http://www.ti.com
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SM65MLVD128DGGR Datenblatt(HTML) 1 Page - Texas Instruments

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FEATURES
APPLICATIONS
LOGIC DIAGRAM
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1 D
SN65MLVD128
SN65MLVD129
SN65MLVD128
SN65MLVD129
SLLS586 – MARCH 2004
1:8 LVTTL TO M-LVDS REPEATER DUAL 1:4 LVTTL TO M-LVDS REPEATER
Bus Pins High Impedance When Disabled or
V
CC ≤ 1.5 V
LVTTL Receiver and Eight Line Drivers
Configured as an 8-Port M-LVDS Repeater –
Independent Enables for each Driver
SN65MLVD128
Output-to-Ouput Skew t
sk(o) ≤ 160 ps
2 LVTTL Receivers and Eight Line Drivers
Part-to-Part Skew t
sk(pp) ≤ 800 ps
Configured as Dual 4-Port M-LVDS Repeaters
Single 3.3-V Voltage Supply
– SN65MLVD129
Bus Pin ESD Protection Exceeds 9 kV
Drivers Meet or Exceed the M-LVDS Standard
Packaged in 48-Pin TSSOP (DGG)
(TIA/EIA-899)
Low-Voltage Differential 30-
Ω to 55-Ω Line
Drivers for Data Rates (1) Up to 250 Mbps or
AdvancedTCA™ (ATCA™) Clock Bus Driver
Clock Frequencies Up to 125 MHz
Clock Distribution
Power Up/Down Glitch Free
Data and Clock Repeating Over Backplanes
Controlled Driver Output Voltage Transition
and Cables
Times for Improved Signal Quality
Cellular Base Stations
(1)
The data rate of a line, is the number of voltage transitions
Central Office Switches
that are made per second expressed in the units bps (bits per
Network Switches and Routers
second).
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
AdvancedTCA, ATCA are trademarks of PCI Industrial Computer Manufacturers Group.
PRODUCTION DATA information is current as of publication date.
Copyright © 2004, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.


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