Datenblatt-Suchmaschine für elektronische Bauteile |
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SN74AUP1G00YZPR Datenblatt(PDF) 4 Page - Texas Instruments |
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SN74AUP1G00YZPR Datenblatt(HTML) 4 Page - Texas Instruments |
4 / 36 page SN74AUP1G00 SCES604I – SEPTEMBER 2004 – REVISED JUNE 2014 www.ti.com 7 Specifications 7.1 Absolute Maximum Ratings (1) over operating free-air temperature range (unless otherwise noted) MIN MAX UNIT VCC Supply voltage range –0.5 4.6 V VI Input voltage range(2) –0.5 4.6 V VO Voltage range applied to any output in the high-impedance or power-off state (2) –0.5 4.6 V VO Output voltage range in the high or low state(2) –0.5 VCC + 0.5 V IIK Input clamp current VI < 0 50 mA IOK Output clamp current VO < 0 50 mA IO Continuous output current 20 mA Continuous current through VCC or GND 50 mA (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed. 7.2 Handling Ratings MIN MAX UNIT Tstg Storage temperature range –65 150 °C Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all 0 2000 pins(1) V(ESD) Electrostatic discharge V Charged device model (CDM), per JEDEC specification 0 1000 JESD22-C101, all pins(2) (1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. (2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. 4 Submit Documentation Feedback Copyright © 2004–2014, Texas Instruments Incorporated Product Folder Links: SN74AUP1G00 |
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