TPIC2101

DC BRUSH MOTOR CONTROLLER

SLIS060 – OCTOBER 1995

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POST OFFICE BOX 655303

POST OFFICE BOX 1443

Output

FET/IGBT

description

The TPIC2101 is a monolithic integrated control circuit designed for direct current (dc) brush motor control that

generates a user-adjustable, fixed-frequency, variable duty cycle, pulse width modulated (PWM) signal

primarily to control rotor speed of a permanent magnet dc motor. The TPIC2101 can also be used to control

power to other loads such as solenoids and incandescent bulbs. This device drives the gate of an external, low

side NMOS power transistor to provide PWM controlled power to a motor or other loads. Inductive current from

motor or solenoid loads during PWM off-time is recirculated through an external diode.

The TPIC2101 accepts a 0% to 100% PWM signal (auto mode) or a 0 V to 2.2 V differential voltage (manual

mode), and internally engages the correct operating mode to accept the input type.

The device operates in a sleep state, a run state, or a fault state. In the sleep state the gate-drive (GD) terminal

is held low and the overall current draw is less than 200

µA. The normal operating mode of the device is in the

run state and is initiated by any speed command. When the device detects an overvoltage or current fault, it

enters the fault state.

The TPIC2101 is offered in a 14-terminal plastic DIP (N) package, and a SOIC (D) package, and is characterized

for operation over the operating free-air temperature range of –40

°C to 105°C.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

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V5P5

MAN

AUTO

SPEED

ROSC

COSC

INT

CCS

AREF

GD

GND

ILS

ILR

D or N PACKAGE

(TOP VIEW)

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of Texas Instruments

standard warranty. Production processing does not necessarily include

testing of all parameters.

Copyright

© 1995, Texas Instruments Incorporated