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Datenblatt-Suchmaschine für elektronische Bauteile |
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Datenblatt-Suchmaschine für elektronische Bauteile |
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LM2675LD-3.3 Datenblatt(PDF) 9 Page - National Semiconductor (TI) |
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LM2675LD-3.3 Datenblatt(HTML) 9 Page - National Semiconductor (TI) |
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9 / 26 page  Test Circuit and Layout Guidelines 01280322 CIN - 22 µF, 50V Tantalum, Sprague “199D Series” COUT - 47 µF, 25V Tantalum, Sprague “595D Series” D1 - 3.3A, 50V Schottky Rectifier, IR 30WQ05F L1 - 68 µH Sumida #RCR110D-680L CB - 0.01 µF, 50V Ceramic FIGURE 2. Standard Test Circuits and Layout Guides Fixed Output Voltage Versions 01280323 CIN - 22 µF, 50V Tantalum, Sprague “199D Series” COUT - 47 µF, 25V Tantalum, Sprague “595D Series” D1 - 3.3A, 50V Schottky Rectifier, IR 30WQ05F L1 - 68 µH Sumida #RCR110D-680L R1 - 1.5 k Ω,1% CB - 0.01 µF, 50V Ceramic For a 5V output, select R2 to be 4.75 k Ω,1% where VREF = 1.21V Use a 1% resistor for best stability. FIGURE 3. Standard Test Circuits and Layout Guides Adjustable Output Voltage Version www.national.com 9 |
Ähnliche Teilenummer - LM2675LD-3.3 |
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Ähnliche Beschreibung - LM2675LD-3.3 |
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