MC74LVX4053

http://onsemi.com

2

X = Don’t Care

Figure 1. Logic Diagram Triple Single−Pole,

Double−Position Plus Common Off

L

L

L

L

H

H

H

H

X

L

L

H

H

L

L

H

H

X

L

H

L

H

L

H

L

H

X

FUNCTION TABLE

Control Inputs

ON Channels

Enable

Select

CBA

L

L

L

L

L

L

L

L

H

Z0

Z0

Z0

Z0

Z1

Z1

Z1

Z1

Y0

Y0

Y1

Y1

Y0

Y0

Y1

Y1

X0

X1

X0

X1

X0

X1

X0

X1

NONE

X0

12

X1

13

A

11

B

10

C

9

ENABLE

6

X SWITCH

Y SWITCH

X

14

ANALOG

INPUTS/OUTPUTS

CHANNEL‐SELECT

INPUTS

PIN 8 = GND

COMMON

OUTPUTS/INPUTS

Y0

2

Y1

1

Y

15

Z0

5

Z1

3

Z

4

Z SWITCH

NOTE: This device allows independent control of each switch.

Channel−Select Input A controls the X−Switch, Input B

controls the Y−Switch and Input C controls the Z−Switch

MAXIMUM RATINGS

Symbol

Parameter

Value

Unit

Negative DC Supply Voltage

(Referenced to GND)

−7.0 to +0.5

V

Positive DC Supply Voltage

(Referenced to GND)

−0.5 to +7.0

−0.5 to +7.0

V

Analog Input Voltage

V

Digital Input Voltage

(Referenced to GND)

−0.5 to 7.0

V

I

DC Current, Into or Out of Any Pin

±20

mA

Storage Temperature Range

−65 to +150

_C

Lead Temperature, 1 mm from Case for 10 Seconds

260

_C

Junction Temperature under Bias

+150

_C

Thermal Resistance

SOIC

TSSOP

143

164

°C/W

Power Dissipation in Still Air,

SOIC

TSSOP

500

450

mW

MSL

Moisture Sensitivity

Level 1

Flammability Rating

Oxygen Index: 30% − 35%

UL−94−VO (0.125 in)

ESD Withstand Voltage

Human Body Model (Note 1)

Machine Model (Note 2)

Charged Device Model (Note 3)

> 2000

> 200

> 1000

V

Latchup Performance

±300

mA

Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality

should not be assumed, damage may occur and reliability may be affected.

1. Tested to EIA/JESD22−A114−A.

2. Tested to EIA/JESD22−A115−A.

3. Tested to JESD22−C101−A.

4. Tested to EIA/JESD78.