MC74HC574AFELG datasheet(2/9 Pages) ONSEMI

Teilenummer	MC74HC574AFELG

Bauteilbeschribung	Octal 3-State Noninverting D Flip-Flop

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MC74HC574A

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Design Criteria

Value

Units

Internal Gate Count*

66.5

ea.

Internal Gate Propagation Delay

1.5

ns

Internal Gate Power Dissipation

5.0

mW

Speed Power Product

0.0075

pJ

*Equivalent to a two−input NAND gate.

MAXIMUM RATINGS

Symbol

Parameter

Value

Unit

VCC

DC Supply Voltage

−0.5 to +7.0

V

VI

DC Input Voltage

−0.5 to VCC + 0.5

V

VO

DC Output Voltage

(Note 1)

−0.5 to VCC + 0.5

V

IIK

DC Input Diode Current

±20

mA

IOK

DC Output Diode Current

±35

mA

IO

DC Output Sink Current

±35

mA

ICC

DC Supply Current per Supply Pin

±75

mA

IGND

DC Ground Current per Ground Pin

±75

mA

TSTG

Storage Temperature Range

−65 to +150

_C

TL

Lead Temperature, 1 mm from Case for 10 Seconds

260

_C

TJ

Junction Temperature under Bias

+150

_C

qJA

Thermal Resistance

SOIC

TSSOP

96

128

_C/W

PD

Power Dissipation in Still Air at 85

_C

SOIC

TSSOP

500

450

mW

MSL

Moisture Sensitivity

Level 1

FR

Flammability Rating

Oxygen Index: 30% − 35%

UL 94 V−0 @ 0.125 in

VESD

ESD Withstand Voltage

Human Body Model (Note 2)

Machine Model (Note 3)

Charged Device Model (Note 4)

> 4000

> 300

> 1000

V

ILatchup

Latchup Performance

Above VCC and Below GND at 85_C (Note 5)

±300

mA

Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality

should not be assumed, damage may occur and reliability may be affected.

1. IO absolute maximum rating must be observed.

2. Tested to EIA/JESD22−A114−A.

3. Tested to EIA/JESD22−A115−A.

4. Tested to JESD22−C101−A.

5. Tested to EIA/JESD78.

RECOMMENDED OPERATING CONDITIONS

Symbol

Parameter

Min

Max

Unit

VCC

DC Supply Voltage

(Referenced to GND)

2.0

6.0

V

VI, VO

DC Input Voltage, Output Voltage

(Referenced to GND)

0

VCC

V

TA

Operating Temperature, All Package Types

−55

+125

_C

tr, tf

Input Rise and Fall Time (Figure 2)

VCC = 2.0 V

VCC = 4.5 V

VCC = 6.0 V

0

1000

500

400

ns

Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond

the Recommended Operating Ranges limits may affect device reliability.

6. Unused inputs may not be left open. All inputs must be tied to a high− or low−logic input voltage level.

Ähnliche Beschreibung - MC74HC574AFELG

Hersteller	Teilenummer	Datenblatt	Bauteilbeschribung
ON Semiconductor	MC74HC574A	178Kb / 8P	Octal 3-State Noninverting D Flip-Flop March, 2000 ??Rev. 8
Integral Corp.	IN74ACT574	220Kb / 5P	OCTAL 3-STATE NONINVERTING D FLIP-FLOP
ON Semiconductor	MC74HC574A	153Kb / 9P	Octal 3-State Noninverting D Flip-Flop May, 2011 ??Rev. 13
System Logic Semiconduc...	SL74HC374	53Kb / 5P	Octal 3-State Noninverting D Flip-Flop
KODENSHI_AUK CORP.	KK74HC374A	250Kb / 6P	Octal 3-State Noninverting D Flip-Flop
Motorola, Inc	MC54HC574A	100Kb / 7P	OCTAL 3-STARE NONINVERTING D FLIP-FLOP
Motorola, Inc	MC54HCT374A	119Kb / 7P	OCTAL 3-STATE NONINVERTING D FLIP-FLOP WITH LSTTL-COM
NXP Semiconductors	74F564	80Kb / 10P	Octal D flip-flop 3-State 1996 Jan 05
ON Semiconductor	MC74HCT574A	162Kb / 8P	Octal 3-State Noninverting D Flip-Flop with LSTTL-Compatible Inputs March, 2000 ??Rev. 8
ON Semiconductor	MC74HCT574A	143Kb / 7P	Octal 3-State Noninverting D Flip-Flop with LSTTL-Compatible Inputs June, 2011 ??Rev. 10

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