Datenblatt-Suchmaschine für elektronische Bauteile |
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MC74HC574AFELG Datenblatt(PDF) 2 Page - ON Semiconductor |
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MC74HC574AFELG Datenblatt(HTML) 2 Page - ON Semiconductor |
2 / 9 page MC74HC574A http://onsemi.com 2 Design Criteria Value Units Internal Gate Count* 66.5 ea. Internal Gate Propagation Delay 1.5 ns Internal Gate Power Dissipation 5.0 mW Speed Power Product 0.0075 pJ *Equivalent to a two−input NAND gate. MAXIMUM RATINGS Symbol Parameter Value Unit VCC DC Supply Voltage −0.5 to +7.0 V VI DC Input Voltage −0.5 to VCC + 0.5 V VO DC Output Voltage (Note 1) −0.5 to VCC + 0.5 V IIK DC Input Diode Current ±20 mA IOK DC Output Diode Current ±35 mA IO DC Output Sink Current ±35 mA ICC DC Supply Current per Supply Pin ±75 mA IGND DC Ground Current per Ground Pin ±75 mA TSTG Storage Temperature Range −65 to +150 _C TL Lead Temperature, 1 mm from Case for 10 Seconds 260 _C TJ Junction Temperature under Bias +150 _C qJA Thermal Resistance SOIC TSSOP 96 128 _C/W PD Power Dissipation in Still Air at 85 _C SOIC TSSOP 500 450 mW MSL Moisture Sensitivity Level 1 FR Flammability Rating Oxygen Index: 30% − 35% UL 94 V−0 @ 0.125 in VESD ESD Withstand Voltage Human Body Model (Note 2) Machine Model (Note 3) Charged Device Model (Note 4) > 4000 > 300 > 1000 V ILatchup Latchup Performance Above VCC and Below GND at 85_C (Note 5) ±300 mA Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. IO absolute maximum rating must be observed. 2. Tested to EIA/JESD22−A114−A. 3. Tested to EIA/JESD22−A115−A. 4. Tested to JESD22−C101−A. 5. Tested to EIA/JESD78. RECOMMENDED OPERATING CONDITIONS Symbol Parameter Min Max Unit VCC DC Supply Voltage (Referenced to GND) 2.0 6.0 V VI, VO DC Input Voltage, Output Voltage (Referenced to GND) 0 VCC V TA Operating Temperature, All Package Types −55 +125 _C tr, tf Input Rise and Fall Time (Figure 2) VCC = 2.0 V VCC = 4.5 V VCC = 6.0 V 0 0 0 1000 500 400 ns Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the Recommended Operating Ranges limits may affect device reliability. 6. Unused inputs may not be left open. All inputs must be tied to a high− or low−logic input voltage level. |
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Ähnliche Beschreibung - MC74HC574AFELG |
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