Datenblatt-Suchmaschine für elektronische Bauteile |
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Si8261ACD-C-IM Datenblatt(PDF) 6 Page - Silicon Laboratories |
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Si8261ACD-C-IM Datenblatt(HTML) 6 Page - Silicon Laboratories |
6 / 40 page Si826x 6 Rev. 1.3 UVLO Threshold + (Si826xxBx mode) VDDUV+ See Figure 12 on page 16. VDD rising 7.5 8.4 9.4 V UVLO Threshold – (Si826xxBx mode) VDDUV– See Figure 12 on page 16. VDD falling 6.9 7.9 8.9 V UVLO lockout hysteresis (Si826xxBx mode) VDDHYS —500 — mV UVLO Threshold + (Si826xxCx mode) VDDUV+ See Figure 13 on page 16. VDD rising 10.5 12 13.5 V UVLO Threshold – (Si826xxCx mode) VDDUV– See Figure 13 on page 16. VDD falling 9.4 10.7 12.2 V UVLO lockout hysteresis (Si826xxCx mode) VDDHYS —1.3 — V AC Switching Parameters Input noise filter cut-off pulse width tNFC — — 15 ns Minimum pulse width tPMIN —30 — ns Propagation delay (Low-to-High) tPLH CL = 200 pF 20 40 60 ns Propagation delay (High-to-Low) tPHL CL = 200 pF 10 30 50 ns Pulse Width Distortion PWD |tPLH –tPHL| — 17 28 ns Propagation Delay Difference5 PDD tPHLMAX –tPLHMIN -1 — 25 ns Rise time tR CL = 200 pF — 5.5 15 ns Fall time tF CL = 200 pF — 8.5 20 ns Device Startup Time tSTART —16 30 µs Common Mode Transient Immunity CMTI Output = low or high (VCM = 1500 V), (IF > 6mA) (See Figure 4) 35 50 — kV/µs Table 2. Electrical Characteristics (Continued)1 VDD =15V or 30 V, GND=0V, IF =6mA, TA = –40 to +125 °C; typical specs at 25 °C Parameter Symbol Test Condition Min Typ Max Unit Notes: 1. See "8.Ordering Guide" on page 23 for more information. 2. Minimum value of (VDD - GND) decoupling capacitor is 1 µF. 3. Both VO pins are required to be shorted together for 4.0 A compliance. 4. When performing this test, it is recommended that the DUT be soldered down to the PCB to reduce parasitic inductances, which may cause over-stress conditions due to excessive ringing. 5. Guaranteed by characterization. |
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