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LM494CN Datenblatt(PDF) 4 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Teilenummer LM494CN
Bauteilbeschribung  Pulse Width Modulated Control Circuit
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Hersteller  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

LM494CN Datenblatt(HTML) 4 Page - National Semiconductor (TI)

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Functional Description
The basic oscillator (switching) frequency is controlled by an
external resistor (RT) and capacitor (CT) The relationship
between the values of RT CT and frequency is shown in
Figure 10
The level of the sawtooth wave form is compared with an
error voltage by the pulse width modulated comparator The
output of the PWM Comparator directs the pulse steering
flip-flop and the output control logic
The error voltage is generated by the error amplifier The
error amplifier boosts the voltage difference between the
output and the 50V internal reference See
Figure 7 for
error amp sensing techniques The second error amp is typi-
cally used to implement current-limiting
The output control logic selects either push-pull or single-
ended operation of the output transistors (see
Figure 6 )
The dead time control prevents on-state overlap of the out-
put transistors as can be seen in
Figure 5 The dead time is
approximately 30% or 50% of the total period if the dead
time control is grounded This dead time can be increased
by connecting the dead time control to a voltage up to 50V
The frequency response of the error amps
(Figure 11) can
be modified by using external resistors and capacitors
These components are typically connected between the
compensation terminal and the inverting input of the error
amps
The switching frequency of two or more LM494 circuits can
be synchronized The timing capacitor CT is connected as
shown in
Figure 8 Charging current is provided by the mas-
ter circuit Discharging is through all the circuits slaved to
the master RT is required only for the master circuit
Test Circuits
TLH10056 – 3
FIGURE 1 Error Amplifier Test Circuit
TLH10056 – 4
FIGURE 2 Current Limit Sense
Amplifier Test Circuit
TLH10056 – 5
TLH10056 – 6
FIGURE 3 Common Emitter Configuration
Test Circuit and Waveform
TLH10056 – 7
TLH10056 – 8
FIGURE 4 Emitter Follower Configuration
Test Circuit and Waveform
TLH10056 – 9
FIGURE 5 Dead Time and Feedback
Control Test Circuit
4


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