R2A20104/114 Series

R03DS0008EJ0301 Rev.3.01

Page 7 of 11

Jan 08, 2016

Absolute Maximum Ratings

Item

Symbol

Value

Unit

Note

Supply voltage

VCC

–0.3 to +24

V

3

GD1 and 2

Peak current

Ipk-gd1, Ipk-gd2

±1

A

3, 4

DC current

Idc-gd1, Idc-gd2

±0.1

A

3

Vref terminal current

Iref

–5

mA

3

Terminal current

It-group

±1

mA

3, 5

RS terminal current

Irs

–500

μA

3

RT terminal current

Irt

–200

μA

3

RAMP terminal current

Iramp

–200

μA

3

BO clamp current

Ibo

300

μA

3

Terminal voltage

Vt-group

–0.3 to Vref

V

3, 6

Vref terminal voltage

Vt-ref

–0.3 to Vref+0.3

V

3

SS terminal voltage

Vt-ss

–0.3 to Vref+1

V

3

Power dissipation

Pt

1

W

3, 7

Operating ambient temperature

Ta-opr

–40 to +125

°C

Junction temperature

Tj

–40 to +150

°C

8

Storage temperature

Tstg

–55 to +150

°C

Notes: 1. Rated voltages are with reference to the AGND and PGND terminal.

2. For the direction of Rated currents, (+) denotes the current flowing into the IC, and (–) denotes the current

flowing out of the IC.

3. Ambience temperature, Ta is 25 degrees centigrade.

4. Transient current when driving a capacitive load.

5. Rated currents of the terminals listed below:

COMP, CSO1, CSO2

6. Rated voltages of the terminals listed below:

in the case of R2A20104FP/R2A20114FP: CS1, CS2, VAC, RS, FB, PD, BO, ERROR, E-DLAY, OFF,

OVP2, FMC, FMR, RT/SYNC, IRAMP, SYNC-O, CT, COMP,

CSO1, CSO2

in the case of R2A20104SP/R2A20114SP: CS1, CS2, VAC, RS, FB, BO, IRAMP, FM, RT/SYNC, CT,

COMP, CSO1, CSO2

7. Thermal resistor

in the case of R2A20104FP/R2A20114FP:

θja = 85.3 degrees centigrade/W

in the case of R2A20104SP/R2A20114SP:

θja = 120 degrees centigrade/W

These values are obtained under the condition that the IC is mounted on the glass epoxy board, of which size

is 50

× 50 × 1.6 [mm] and wiring density is 10%.

8. Stresses exceeding the absolute maximum ratings may damage the device.

These are stress ratings only. Functional operation above the recommended operating ambient temperature

range is not implied.

Extended exposure to stresses above the absolute maximum ratings may affect device reliability.