Datenblatt-Suchmaschine für elektronische Bauteile |
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MC1741CDR2 Datenblatt(PDF) 3 Page - ON Semiconductor |
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MC1741CDR2 Datenblatt(HTML) 3 Page - ON Semiconductor |
3 / 8 page MC1741C http://onsemi.com 3 Figure 1. Burst Noise versus Source Resistance Figure 2. RMS Noise versus Source Resistance Figure 3. Output Noise versus Source Resistance Figure 4. Spectral Noise Density Figure 5. Burst Noise Test Circuit Unlike conventional peak reading or RMS meters, this system was especially designed to provide the quick response time essential to burst (popcorn) noise testing. The test time employed is 10 sec and the 20 mV peak limit refers to the operational amplifier input thus eliminating errors in the closed loop gain factor of the operational amplifier. RS, SOURCE RESISTANCE (Ω) 0 10 100 1000 10 100 1.0 k 10 k 100 k 1.0 M BW = 1.0 Hz to 1.0 kHz RS, SOURCE RESISTANCE (Ω) 0.1 1.0 10 100 10 100 1.0 10 k 100 k 1.0 M BW = 1.0 Hz to 1.0 kHz RS, SOURCE RESISTANCE (Ω) 0.01 0.1 1.0 10 10 100 1.0 k 10 k 100 k 1.0 M AV = 1000 10 1.0 100 f, FREQUENCY (Hz) 10 100 1.0 k 100 k 10 k 14.0 12.0 10.0 8.0 4.0 2.0 0 6.0 AV = 10, RS = 100 k Ω + 1.0 k Operational Amplifier Under Test Low Pass Filter 1.0 Hz to 1.0 kHz 100 k x500 x2 To Pass / Fail Indicator - 100 k 100 k - + - + Positive Threshold Voltage Negative Threshold Voltage |
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Ähnliche Beschreibung - MC1741CDR2 |
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