MC1741C

http://onsemi.com

3

Figure 1. Burst Noise versus Source Resistance

Figure 2. RMS Noise versus Source Resistance

Figure 3. Output Noise versus Source Resistance

Figure 4. Spectral Noise Density

Figure 5. Burst Noise Test Circuit

Unlike conventional peak reading or RMS meters, this system was

especially designed to provide the quick response time essential

to burst (popcorn) noise testing.

The test time employed is 10 sec and the 20 mV peak limit

refers to the operational amplifier input thus eliminating errors

in the closed loop gain factor of the operational amplifier.

0

10

100

1000

10

100

1.0 k

10 k

100 k

1.0 M

BW = 1.0 Hz to 1.0 kHz

0.1

1.0

10

100

10

100

1.0

10 k

100 k

1.0 M

BW = 1.0 Hz to 1.0 kHz

0.01

0.1

1.0

10

10

100

1.0 k

10 k

100 k

1.0 M

10

1.0

100

f, FREQUENCY (Hz)

10

100

1.0 k

100 k

10 k

14.0

12.0

10.0

8.0

4.0

2.0

0

6.0

+

1.0 k

Operational Amplifier

Under Test

Low Pass

Filter

1.0 Hz to 1.0 kHz

100 k

x500

x2

To Pass / Fail

Indicator

-

100 k

100 k

-

+

-

+

Positive

Threshold

Voltage

Negative

Threshold

Voltage